Auger Electron Spectroscopy in high vacuum: Nanocharacterisation in the Scanning Electron Microscope

نویسندگان
چکیده

برای دانلود رایگان متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

the scanning electron microscope

it is only thirteen years since the scanning electron microscope has been available commercially. yet, even in this short period of time, this instrument has been a powerful tool in the investigation of topography, electrical and magnetic properties, crystal structure, cathodoluminescent characteristics etc. of solid specimens. today, this type of microscope has opened its place alongside the c...

متن کامل

The Scanning Confocal Electron Microscope

The Scanning Confocal Electron Microscope, is an instrument which permits the observation and characterization of sub-surface structures of thick, optically opaque materials at nanometer level resolutions. The instrument merges the capabilities of the scanning, transmission and x-ray microscopes, and achieves unprecedented resolutions in optically dense materials, by implementing the technology...

متن کامل

Critical Issues in Scanning Electron Microscope Metrology

National Institute of Standards and Technology, Gaithersburg, MD 20899-0001 During the manufacturing of presentday integrated circuits, certain measurements must be made of the submicrometer structures composing the device with a high degree of repeatability. Optical microscopy, scanning electron microscopy, and the various forms of scanning probe microscopies are major microscopical techniques...

متن کامل

X-ray Microanalysis of Cultured Cells in the Scanning Electron Microscope and in the Scanning Transmission Electron Microscope: a Comparison

X-ray microanalysis of cultured cells as “whole mounts” (i.e., not sectioned) is used frequently e.g., to study mechanisms of ion transport. Cells can be cultured either on solid substrates or on thin plastic films on grids. Cells cultured on solid substrates are analyzed in the scanning electron microscope at relatively low accelerating voltage, cells cultured on thin films can be analyzed in ...

متن کامل

Electron microscopy’s multi-tool: the Scanning Transmission Electron Microscope

A dedicated Scanning Transmission Electron Microscope is ideally coupled with the energy dispersive x-ray and electron energy loss spectroscopies to obtain information about the chemical composition, morphology and electronic structure on the nanoscale. With several signals being available simultaneously with the pass of a subnanometre-sized beam, this instrument can answer questions from a bro...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Journal of Physics: Conference Series

سال: 2014

ISSN: 1742-6588,1742-6596

DOI: 10.1088/1742-6596/522/1/012027